Nanowire Field-Effect Transistor with Bi1.5Zn1.0Nb1.5O7 Dielectric

Wangyang Fu,Zhi Xu,Kaihui Liu,Wenlong Wang,Xuedong Bai,Enge Wang
DOI: https://doi.org/10.1063/1.3037219
IF: 4
2008-01-01
Applied Physics Letters
Abstract:In this letter, amorphous Bi1.5Zn1.0Nb1.5O7 films with large permittivity (∼70) are prepared as the gate dielectric for ZnO nanowire field-effect transistors by using low-temperature (∼100°C) pulsed laser deposition. The transistors exhibit a low operation gate voltage (<3V), a high carrier mobility (∼42cm2∕Vs), and a steep subthreshold swing up to 240mV/decade. These results combined with near-room-temperature processing technique suggest that the nanowire transistor with Bi1.5Zn1.0Nb1.5O7 dielectric is a promising candidate for high-performance flexible electronics.
What problem does this paper attempt to address?