PREPARATION AND CHARACTERIZATION OF BORON DOPED CARBON THIN FILM BY LOW PRESSURE CHEMICAL VAPOR DEPOSITION

YANG Wenbin,ZHANG Litong,CHENG Laifei,XU Yongdong,LIU Yongsheng
DOI: https://doi.org/10.3321/j.issn:0454-5648.2007.05.002
2007-01-01
Abstract:Boron doped carbon(BCx)thin film was prepared at 1 100 ℃ on carbon fiber substrate by low pressure chemical vapor deposition(LPCVD)from BCl3 and C3H6 as boron and carbon sources respectively.Scanning electron microscopy observation results show that the BCx coating has a smooth surface and the cross section of BCx coating exhibits a very finely laminated structure.X-ray diffraction analysis results show that the BCx coating consists of B4C and pyrolytic carbon with a high degree of graphitization.X-ray photoelectron spectroscopy results show that there is 15%(in mole,the same below)boron induced in the BCx coating.Five different chemical surroundings of boron atoms were confirmed in the BCx coating,namely,B4C,boron atoms substituted in the graphite-like structures,and mixtures of B—C bonding and B—O bonding referred to as BC2O and BCO2,B2O3,respectively.More than 40 % of boron atoms are included by substitution in the graphitic-like structure.
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