BN Films Deposited by HFPECVD and the Mechanism of the Process

董博,张溪文,韩高荣
DOI: https://doi.org/10.3969/j.issn.1673-2812.2004.06.018
2004-01-01
Abstract:BN films were deposited by HFPECVD (hot filament plasma enhanced chemical vapor deposition).The sutdy of infrared absorption patterns (IR) and X-ray diffraction diagrams (XRD) of the films reveals that the fraction of cubic boron nitride(C-BN) iS Strongly depended on the effect of r.f. power and the flow ratio of N 2.When r.f. power lower than 200W,the fraction of cubic boron nitride increases with the power increasing; while when r.f. power higher than 200W,it decreases with the power increasing.With the increasing of the flow ratio of N 2 the rate of growth of the films increases,however the fraction of cubic boron nitride (c-BN) decreases.At last we infered the mechanism of c-BN formation by the study of IR of the films deposited by different time.
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