Growth and Characterization of <110> Oriented ZnTe Single Crystal

Reng Wang,Weizheng Fang,Pei Zhao,Caihong Zhang,Lei Zhang,Jin Ge,Shixin Yuan
DOI: https://doi.org/10.1117/12.754091
2007-01-01
Abstract:ZnTe crystal has been grown at a temperature as low as 1060°C using Te solvent method. X-ray diffraction showed that the ZnTe crystals were grown from <110> oriented. The transmission was over 60% from 2 μm to 22 μm by using Fourier Transform Infrared Spectrometer. The etch pit density in the sliced wafer was about 2×104 cm-2 detected by Scan Electronic Microscopic. The transmission spectrums were measured from 0.2 to 3 THz by using Terahertz Time Domain Spectroscopy. And the refractive index and extinction coefficient were obtained through analysis of the time domain waveform.
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