Influence of Sputtering Pressure on the Properties of ZnO:Ga Films Prepared by DC Reactive Magnetron Sputtering

Quanbao Ma,Liping Zhu,Zhizhen Ye,Haiping He,Jingrui Wang,Shaohua Hu,Binghui Zhao
DOI: https://doi.org/10.3321/j.issn:1000-324x.2007.06.019
2007-01-01
Abstract:Ga-doped zinc oxide (ZnO:Ga) transparent conductive films with highly (002)-preferred orientations were deposited on glass substrates by DC reactive magnetron sputtering. Effects of deposition pressure on the structural, electrical and optical properties of ZnO:Ga films were investigated. The X-ray diffraction (XRD) studies show that the films are highly oriented with their crystallographic c-axis perpendicular to the substrate almost independent on the deposition pressure. The morphology of the ZnO:Ga films is sensitive to the change of the deposition pressure. The transmittance of the ZnO:Ga thin films is over 90% and the lowest resistivity for ZnO:Ga films is 4.48 × 10 -4 Ω·cm.
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