Growth and Depth Dependence of Visible Luminescence in Wurtzite Inn Epilayers

XD Pu,WZ Shen,ZQ Zhang,H Ogawa,QX Guo
DOI: https://doi.org/10.1063/1.2193059
IF: 4
2006-01-01
Applied Physics Letters
Abstract:We present detailed investigation of growth and depth dependence of visible (∼1.9eV) photoluminescence (PL) in wurtzite InN epilayers grown by magnetron sputtering. For normal surface incidence, PL peak was found to redshift with increasing growth temperatures. Cross-sectional PL measurements were able to separate contributions from the InN epilayers and sapphire substrates, which not only demonstrated the visible luminescence in InN but also revealed the blueshift of the PL peak with laser spot focusing from epilayer surface toward the interface. The results have been well explained by the growth mechanism and residual strain along growth direction of InN epilayers.
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