Absolute Flatness Measurement of Optical Surfaces

XU Chen,CHEN Lei
DOI: https://doi.org/10.3321/j.issn:1002-1582.2006.05.013
2006-01-01
Abstract:Two methods were used to testing three high accuracy optical surfaces using a Fizeau interferometer.The properties of Zernike polynomials were utilized to fit data points from four interferograms.Then the Zernike coefficients of three flats were derived and the absolute distributions of three flats were obtained.The second method was even-odd method.Using the symmetry properties of odd and even functions,a flat was decomposed to four components: even-odd、odd-even、even-even and odd-odd functions,the absolute distribution of three flats were obtained by solving each component.The two methods were programmed for simulation and experiment,and experiments were done to achieve accurate flatness measurement without a reference flat.
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