Measurement of Film's Dielectric Parameters with Space-Adjustable Non-Contact 3-Electrode Method

Ying Liu,Lei Wang,Xiaolong Cao,Zhaolin Li
DOI: https://doi.org/10.3321/j.issn:0253-987X.2006.06.020
2006-01-01
Abstract:High precision air-medium space-adjustable non-contact 3-electrode system is designed to investigate the technical matters in εr and tanδ measurement of films thinner than 30 μm, including the measurement accuracy of sample thickness, the choice of whole thickness of film multilayers, the air space remained between the sample and electrode. Simultaneously, two non-contact methods are compared to analyze the individual applicability. The results indicate that the air-medium space-adjustable non-contact 3-electrode method can be applied to plate samples and thin films with measuring error of εr less than 5% and the order of tanδ up to 10-5.
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