Abstract:Magneto-electric materials with low loss have prospective applications in microwave systems as they enable miniaturization and broadband impedance matching. Two example applications are antennas and filters in sub-6G communication systems. Therefore, high-accuracy and wideband testing are critical for magneto-electric materials, whose complex permittivity and permeability are usually dependent on frequency. In this paper, the mutual interference between the electric and magnetic field within magneto-electric material samples was seriously considered. It was found that the results calculated with the original perturbation formula were overestimated when the sample size was not so small or higher-order modes are used, especially when the electric or magnetic field is perpendicular to the material under test. Two methods based on perturbation, namely the iteration method and the multi-state method are proposed to reduce the impact of the mutual interference, which have been proven to be direct and effective through theoretical analysis and experiments. Finally, several rod-shaped specimens processed from several standard dielectric materials (PTFE, fused silica, Al<sub>2</sub>O<sub>3</sub>) and synthesized magneto-electric materials were measured in a fabricated cavity with a vector network analyzer. Experimental results show that the results obtained by the modified formula are more accurate than those obtained by the original formula, and are in good agreement with the data measured by other methods.

Newly Developed Technique for Permittivity Measurement of Thin Film by Perturbation

Measurement of Complex Permittivity in Microwave Frequency of Thin Film Materials

Measurement based on twice cavity perturbations for permittivity of dielectric thin films

Measurement of Dielectric Constant of Thin Film Materials at Microwave Frequencies

Measurement of microwave electromagnetic parameters of nanostructural magnetic films by using cavity perturbation

A new perturbation method for determining the broadband complex permeability of magnetic thin films

A New Method for Determination of the Optical Constants and Thickness of Thin Film

Measurement for complex permittivity and complex permeability of film

Nondestructive In-situ Permittivity Measurement of Liquid Within a Bottle Using an Open-Ended Microwave Waveguide

Contactless Measurement of Thin Film Conductivity by A Microwave Compact Equipment

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

An Improved Cavity-Perturbation Approach for Simultaneously Measuring the Permittivity and Permeability of Magneto-Dielectric Materials in Sub-6G

Local Permittivity Measurement of Dielectric Materials Based on the Non-Contact Force Curve of Microwave Atomic Force Microscopy

Measuring Technique and Error Analysis of Complex Permittivity of Polymer Films Based on Contact Method

Quantitative Evaluation of Local Permittivity of Semiconductor Nanomaterials Using Microwave Atomic Force Microscopy

Evaluation of microwave dielectric properties of giant permittivity materials by a modified resonant cavity method

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a "Thin Film—Substrate" Structure

Non-contact measurement of complex permittivity based on coupled magnetic and electric resonances

Complex-permittivity measurement on high-Q materials via combined numerical approaches

A Novel Permittivity Measurement Method Using Multiple TM mn0 Modes of Cylindrical Cavity

Far-field Characterization of Material Permittivity Based on Nonlinear Inversions