Strain Effect on Photoluminescence from InGaN/GaN and InGaN/AlGaN MQWs

Yu Tongjun,Kang Xiangning,Qin Zhixin,Chen Zhizhong,Yang Zhijian,Hu Xiaodong,Zhang Guoyi
DOI: https://doi.org/10.3969/j.issn.1674-4926.2006.z1.005
2006-01-01
Chinese Journal of Semiconductors
Abstract:Photoluminescence,HR-XRD,and Raman scattering spectra of InGaN/GaN MQWs and InGaN/AlGaN on sapphire and membranes with no substrate fabricated by laser lift-off are studied. In contrast to the emission peak from the membrane samples of InGaN/GaN MQWs, which blue-shifts after annealing at 700℃, a red-shift of the PL peak position in the InGaN/AlGaN MQW membrane sample is observed,showing different strain effects in these MQWs. In Raman scattering spectra,the InGaN/GaN MQW film without sapphire substrate has a lower E2mode frequency (567. 5cm-1) than that of the films with substrate (569. 1cm-1),which indicates that the compressive stress in the films is released partially when the sapphire substrate is taken off.
What problem does this paper attempt to address?