State-of-art of delay testing

Shao Jing-bo,Ma Guang-sheng,Liu Xiao-xiao

DOI: https://doi.org/10.1109/CAIDCD.2006.329360

2006-01-01

Abstract:This paper overviews the research work on delay testing, focusing on the diagnosis of delay testing and fault set compaction, and approaches to delay testing are analyzed, pros and cons of each method is discussed, the future efforts of researchers are pointed out.

What problem does this paper attempt to address?

State-Of-Art Of Delay Tesing

Shao Jing-Bo,Ma Guang-Sheng,Liu Xiao-Xiao

2006-01-01

Abstract:This paper overviews the research work on delay testing, focusing on the diagnosis of delay testing and fault set compaction, and approaches to delay testing are analyzed, pros and cons of each method is discussed, the future efforts of researchers are pointed out.
Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

Dong Xiang,Yang Zhao,Kaiwei Li,Hideo Fujiwara

DOI: https://doi.org/10.1109/TEST.2007.4437636

2007-01-01

Abstract:Test generation and fault simulation of path delay faults are very time-consuming. A new fault simulation method of fully enhanced scan designed circuits is proposed for path delay faults based on single stuck-at tests without circuit transformation. The proposed method identifies robustly and non-robustly testable paths first, for which a selected path circuit (SPC) is constructed. The SPC circuit contains no internal fanouts. Fault simulation of non-robustly testable paths is reduced to 3-valued logic simulation of the SPC circuit. Fault simulation is completed on the SPC circuit by only tracing the active part of SPC circuit. An effective fault dropping technique is also adopted based on the selective tracing scheme. The proposed fault simulation scheme is extended to that of robustly testable path delay faults. Experimental results confirm that the proposed fault simulator is exact. It is shown according to experimental results that the proposed fault simulator gets exact fault simulation results in very short time. Sufficient experimental results are presented to compare with previous methods on CPU time and accuracy.
A real-time approach to delay estimation based on the Least-Square algorithm

Zhen WANG,Bin WU

DOI: https://doi.org/10.3969/j.issn.1004-4523.2009.06.012

2009-01-01

Abstract:The delay estimation and compensation are key problems in real-time substructure testing because the delay of servo-hydraulic loading system may induce failure due to experimental instability. After analyzing the shortcomings of the two other methods for estimating delay, the paper establishes an approximate relationship between displacements and system delay according to Taylor series firstly, and then proposes a real-time approach to delay estimation based on fading memory recursive Least-Square algorithm. Simulation results of delay estimation indicate that the approach converges rapidly and accurately, and is able to effectively track time-varying delay even though random measurement errors and amplitude errors are taken into account. A numerical example of real-time substructure testing with delay compensation shows that the accuracy and the convergence speed of the delay estimation method and the effect of delay compensation are rather satisfactory. The approach may be superior for real-time substructure testing to the two other methods.
A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

Zhen Chen,Sharad C. Seth,Dong Xiang

DOI: https://doi.org/10.1109/vts.2010.5469547

2010-01-01

Abstract:Test power, volume, and time are the major test cost parameters that must be minimized while achieving the desired level of fault coverage. Unlike prior research in delay fault testing that has focused on at most two test cost parameters, the hybrid (LOS+LOC) scheme proposed here simultaneously considers all three cost parameters and achieves better fault coverage than prior schemes, as demonstrated by experimental results. A factor of (n/logn) reduction in test power is achieved by the use of a nonlinear double-tree-scan (DTS) structure instead of linear scan chain of length n. Concomitantly, by exploiting the permutation feature of DTS, whereby the same test data can be loaded in multiple ways, we also achieve substantial reductions in the test-data volume. By incorporating the Illinois scan (ILS) within this framework, we minimize not only the test time but also achieve further reductions in test-data volume.
The Research of Fault Diagnosis Methods and Realization with Microprocessor-based Circuit Board

Huang Ling,Tian Shu-lin,Lan Jing-chuan

DOI: https://doi.org/10.3969/j.issn.1003-0107.2010.06.004

2010-01-01

Abstract:The test circuit with micro processor circuit is an important topic in the fault diagnosis of circuit board.In this article,mainly study the fault diagnosis method and realization of complex circuit with microprocessor,improving versatility of ITA in the development of test program,and controllability of test procession.
Investigations on Delay Interconnect Lines for High-Speed Designs with the Numerical Technique

WL Yuan,EP Li

DOI: https://doi.org/10.1109/isemc.2003.1236666

2003-01-01

Abstract:With the advancements in electronics, interests in interconnect and package in high-speed circuits are greatly increased. For precise timing among high-speed modules to synchronize signals and harmonize communication between modules, interconnect need be designed with high accuracy and are often meandered to equalize delay. The paper will present the investigations on the effects of different serpentine interconnect lines with various spacing, thickness and rise/fall edges on delay with a full-wave numerical technique, the finite-difference time-domain method. The insights and results acquired can be used to verify and optimize interconnect and timing designs for signal integrity purposes.
An improved method for test chip design

PAN Wei-wei,ZHANG Bo,ZHENG Yong-jun,SHI Zheng,YAN Xiao-lang

2013-01-01

Abstract:The rapid development of IC manufacturing technology poses huge challenges to localize an electrical defect to a specific area on the IC.Either traditional or existing addressable design methods of test chip fail to fulfill the current requirements for fast and accurate defect localization.In this paper,we present an improved method for addressable test chip design.For electrical testing of test chip,four-terminal connection of each test structure and single NMOS transistor as switch are used to improve measurement accuracy,peripheral circuits design simplicity as well as area efficiency.For defect localization,only a small amount of pads are added and used together with switches to localize physical faults.This method is used in a 110nm CMOS technology and verified by the silicon results,which shows several real defects(metal open,etc) are localized to help determine the physical root causes and realize a rapid yield improvement.
New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Boxue Yin,Dong Xiang,Zhen Chen

DOI: https://doi.org/10.1109/vlsi.design.2009.64

2009-01-01

Abstract:The small delay defects testing has two challenges. One is that the longest testable path selection for every target fault in ATPG consumes much CPU time. The other is the test data volume are very large. In this paper, we propose two strategies to resolve these two problems. A new path selection in advance scheme is proposed to accelerate ATPG. It aims to find fewer paths and cover more faults in advance, which is different from the previous works. To reduce the test data volume, we propose a novel scan-based test scheme. We partition the scan flip-flops into some scan chains. The first scan flip-flop of every scan chain works in enhanced scan mode. And other scan flip-flops work in broad-side mode. This can significantly increase the don't care bits of every test pattern and provide more room for test compaction. Then the test pattern count can be reduced significantly. Experimental results show the efficiency of these techniques.
A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Botao Sun,Jianhua Feng,Teng Lin

DOI: https://doi.org/10.1109/icsict.2008.4734987

2008-01-01

Abstract:With the increased use of FPGA in widespread applications, its' size and speed has been rapidly increased, so more and more problems associated with performance defects are emerging. Performance defects such as delay defects will not lead to a functional fault, but will limit the frequency of the system. Only Stuck-at testing has not been sufficient to guarantee the reliability and quality, so testing delay fault becomes necessary. In this paper, in order to improve the efficiency and coverage of delay test, we first select the most suitable delay fault model for FPGAs, which is a good simulation for the actual situation. At the same time we proposed a new configuration on the basis of this. This method takes full advantage of the FPGAs' reconfiguration feature. It not only omits complex test pattern generation, but also optimizes the BIST circuits to minimize the area cost, and reaches higher fault coverage. To verify the theory, we use Xilinx vertex4 devices on the experimental test, and achieved approving results.
Test compaction for small-delay defects using an effective path selection scheme

Dong Xiang,Jianbo Li,Krishnendu Chakrabarty,Xijiang Lin

DOI: https://doi.org/10.1145/2491477.2491488

2013-01-01

Abstract:Testing for small-delay defects (SDDs) requires fault-effect propagation along the longest testable paths. However, identification of the longest testable paths requires high CPU time, and the sensitization of all such paths leads to large pattern counts. Dynamic test compaction for small-delay defects is therefore necessary to reduce test-data volume. We present a new technique for identifying the longest testable paths through each gate in order to accelerate test generation for SDDs. The resulting test patterns sensitize the longest testable paths that pass through each SDD site. An efficient dynamic test compaction method based on structural analysis is presented to reduce the pattern count substantially, while ensuring that all the longest paths for each SDD are sensitized. Simulation results for a set of ISCAS 89 and IWLS 05 benchmark circuits demonstrate the effectiveness of this method.
Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Dong Xiang,Kaiwei Li,Hideo Fujiwara,Jiaguang Sun

DOI: https://doi.org/10.1109/iccd.2006.4380854

2006-01-01

Abstract:A new rest generation method of fully scanned or combinational circuits is proposed for complete coverage of path delay faults based on single stuck-at tests. The proposed method adds the target path into the original circuit, where all off inputs of the path are connected with corresponding nodes in the original circuit. Test generation of the path delay fault is reduced to that of the single stuck-at fault at the fanout branch, where the additional path connects with its source node in the original circuit. A disjoint dynamic test compaction scheme is proposed to reduce the size of the test set in the process of test generation. A conjoint test compaction scheme is proposed based on fanout counts of the paths. The proposed method presents a very compact test set for complete coverage of robustly and non-robustly testable path delay faults.
Recent Developments on Time-Delay Neural Networks

Zheng-Guang Wu,Yun Chen,Xusheng Lei,Kun Liu,Hui Zhang

DOI: https://doi.org/10.1155/2015/865409

2015-01-01

Abstract and Applied Analysis

Abstract:Over the past several decades, an amount of attention has been devoted to neural networks, which have wide applications in many areas, such as signal processing, pattern recognition, and combinatorial optimization. On the other hand, time delays occur in electronic implementation of analog neural networks because of the transmission of signal and the finite switching speed of amplifiers and can lead to the instability and poor performance of systems; thus neural networks with time delay have also been studied extensively because numerous interesting results have been obtained over the last decade, including stability analysis, state estimation, and passivity. In this special issue, we have accepted seven papers. The paper titled “New Pinning Synchronization of Complex Networks with Time-Varying Coupling Strength, NonDelayed and Delayed Coupling” by G. Wang et al. studies the pinning synchronization problem for a class of complex networks by a stochastic viewpoint, in which both time-varying coupling strength and nondelayed and delayed coupling are included. The paper titled “A Novel Model of Conforming Delaunay Triangulation for Sensor Network Configuration” by Y. Ma et al. proposes a new method for solvingDelaunayTriangulation problem,which is called endpoint triangle’s circumcircle model (ETCM).The paper titled “Multimodel Modeling and Predictive Control for DirectDrive Wind Turbine with Permanent Magnet Synchronous Generator” by L. Wang et al. establishes a method based on multimodel modeling and predictive control is proposed for the optimal operation of direct-drive wind turbine with permanent magnet synchronous generator. The paper titled “Independent Component Analysis Based on Information Bottleneck” by Q. Ke et al. provides the equivalence of two algorithms of independent component analysis (ICA) based on the information bottleneck (IB). In “Nonlinear Time-Delay Suspension Adaptive Neural Network Active Control” by Y. Zhu and S. Zhu, a quarter-vehicle magnetorheological active suspension nonlinear model with time delay is established, and an adaptive neural network structure for magnetorheological active suspension is presented. The paper titled “An Adaptive Regulator for Space Teleoperation System in Task Space” by C. Ge et al. studies the problem of the gravity information for bilateral teleoperation. The paper titled “Robust Stabilization of Linear Switching Systems with both Input and Communication Delays” by L. Jia and Z. Sheng considers the stabilization control of a class of linear switching systems with time delays in both the input and the communication channels.
Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill

Dong Xiang,Kele Shen,Bhargab B. Bhattacharya,Xiaoqing Wen,Xijiang Lin

DOI: https://doi.org/10.1109/tcad.2015.2474365

IF: 2.9

2016-01-01

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Abstract:At-speed testing of deep-submicrometer or nano-scale integrated circuits (ICs) consumes excessive power and creates hotspots and temperature gradient in the chip-under-test. The problem worsens for 3-D ICs, where heat dissipation across layers is more unbalanced. These hotspots in a circuit often cause severe degradation of performance and reliability, as a rise in temperature can introduce an extra delay along paths. As a result, the delay of an otherwise fault-free path may exceed the functional clock period. Such thermal emergencies can thus lead to over-detection and undue yield loss during testing. Their effects will be more severe for small-delay defects (SDDs), which target to sensitize the long paths in a circuit. In this paper, we quantify, for the first time, the impact of thermal emergencies on SDDs and provide a solution to mitigate them. The proposed method is based on: 1) a new thermal-aware (TA) path-selection method, 2) a TA test-ordering method, and 3) an effective scan architecture and a test-application scheme. Experimental results on benchmarks demonstrate that the new method can significantly reduce the number of over-detections of SDDs.
Research progress on short duration test techniques and its application

Jialing Le,Weixiong Liu,He Wei,Zhonghua Zheng

2003-01-01

Abstract:null
On the delay performance in a large-scale wireless sensor network: measurement, analysis, and implications

Jiliang Wang,Wei Dong,Zhichao Cao,Yunhao Liu

DOI: https://doi.org/10.1109/TNET.2013.2296331

2015-02-01

IEEE/ACM Transactions on Networking

Abstract:We present a comprehensive delay performance measurement and analysis in a large-scale wireless sensor network. We build a lightweight delay measurement system and present a robust method to calculate the per-packet delay. We show that the method can identify incorrect delays and recover them with a bounded error. Through analysis of delay and other system metrics, we seek to answer the following fundamental questions: What are the spatial and temporal characteristics of delay performance in a real network? What are the most important impacting factors, and is there any practical model to capture those factors? What are the implications to protocol designs? In this paper, we identify important factors from the data trace and show that the important factors are not necessarily the same with those in the Internet. Furthermore, we propose a delay model to capture those factors. We revisit several prevalent protocol designs such as Collection Tree Protocol, opportunistic routing, and Dynamic Switching-based Forwarding and show that our model and analysis are useful to practical protocol designs.
The Status Quo and Trend of Research on Modern Fault Diagnosis

ZHAO Xiang,HUANG Lei,LIU Jian,ZHOU Shao-qi

DOI: https://doi.org/10.3969/j.issn.1672-7843.2006.02.022

2006-01-01

Abstract:This paper has summarized the history and status quo of the theory and engineering application for fault diagnostic technique, analyzed the process and essence of fault diagnostic, introduced some diagnostic methods in common use, and especially mentioned some new trends of modern diagnostic methods as hybrid intelligent diagnosis, BIT and remote co-operative diagnosis. Lastly,we point out some problems that should be emphasized, and predict some future research directions about modern fault diagnosis.
Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Dong Xiang,Boxue Yin,Krishendu Chakrabarty

DOI: https://doi.org/10.1109/ATS.2009.44

2009-01-01

Abstract:Testing for small-delay defects requires fault-effect propagation along the longest testable paths. However, the selection of the longest testable paths requires high CPU time and leads to large pattern counts. Dynamic test compaction for small-delay defects has remained largely unexplored thus far. We propose a path-selection scheme to accelerate ATPG based on stored testable critical-path information. A new dynamic test-compaction technique based on structural analysis is also introduced. Simulation results are presented for a set of ISCAS’89 benchmark circuits.
Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Dong Xiang,Krishnendu Chakrabarty,Dianwei Hu,Hideo Fujiwara

DOI: https://doi.org/10.1109/ats.2007.20

2007-01-01

Abstract:A new scan architecture, called enhanced scan forest, is proposed to detect path delay faults and reduce test stimulus data volume, test response data volume, and test application time. The enhanced scan forest architecture groups scan flip- flops together, where all scan flip-flops in the same group are assigned the same value for all test vectors. All scan flip- flops in the same group share the same hold latch, and the enhanced scan forest architecture makes the circuit work in the same way as a conventional enhanced scan design. The area overhead of the proposed enhanced scan forest is greatly reduced compared to that for enhanced scan design. A low- area-overhead zero-aliasing test response compactor is designed for path delay faults. Experimental results for the IS- CAS benchmark circuits are presented to demonstrate the effectiveness of the proposed method.
Thermal-aware small-delay defect testing in integrated circuits

Yu Bai,Dong Xiang

DOI: https://doi.org/10.1109/CSTIC.2016.7463920

2016-01-01

Abstract:At-speed testing of deep-submicron or nano-scale integrated circuits (IC) consumes excessive power and creates hotspots and temperature gradient in the chip-under-test. The problem worsens for 3D ICs, where heat dissipation across layers is more unbalanced. These hotspots in a circuit often cause severe degradation of performance and reliability, as a rise in temperature can introduce an extra delay along paths. An effective scan architecture and test application scheme are presented to handle the problem.
A comprehensive review of delay analysis techniques for solving concurrent delays

Huy Minh Vo,Jyh-Bin Yang,Veerakumar Rangasamy

DOI: https://doi.org/10.1108/ecam-10-2023-1022

2024-02-21

Engineering Construction & Architectural Management

Abstract:Purpose Construction projects commonly encounter complicated delay problems. Over the past few decades, numerous delay analysis methods (DAMs) have been developed. There is no consensus on whether existing DAMs effectively resolve delays, particularly in the case of complex concurrent delays. Thus, the primary objective of this study is to undertake a comprehensive and systematic literature review on concurrent delays, aiming to answer the following research question: Do existing delay analysis techniques deal with concurrent delays well? Design/methodology/approach This study conducts a comprehensive review of concurrent delays by both bibliometric and systematic analysis of research publications published between 1982 and 2022 in the Web of Science (WoS) and Scopus databases. For quantitative analysis, a bibliometric mapping tool, the VOSviewer, was employed to analyze 68 selected publications to explore the co-occurrence of keywords, co-authorship and direct citation. Additionally, we conducted a qualitative analysis to answer the targeted research question, identify academic knowledge gaps and explore potential research directions for solving the theoretical and practical problems of concurrent delays. Findings Concurrent delays are a critical aspect of delay claims. Despite DAMs developed by a limited number of research teams to tackle issues like concurrence, float consumption and the critical path in concurrent delay resolution, practitioners continue to face significant challenges. This study has successfully identified knowledge gaps in defining, identifying, analyzing and allocating liability for concurrent delays while offering promising directions for further research. These findings reveal the incompleteness of available DAMs for solving concurrent delays. Practical implications The outcomes of this study are highly beneficial for practitioners and researchers. For practitioners, the discussions on the resolution process of concurrent delays in terms of identification, analysis and apportionment enable them to proactively address concurrent delays and lay the groundwork for preventing and resolving such issues in their construction projects. For researchers, five research directions, including advanced DAMs capable of solving concurrent delays, are proposed for reference. Originality/value Existing research on DAMs lacks comprehensive coverage of concurrent delays. Through a scientometric review, it is evident that current DAMs do not deal with concurrent delays well. This review identifies critical knowledge gaps and offers insights into potential directions for future research.

engineering, civil, industrial,management

State-of-art of delay testing

State-Of-Art Of Delay Tesing

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

A real-time approach to delay estimation based on the Least-Square algorithm

A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

The Research of Fault Diagnosis Methods and Realization with Microprocessor-based Circuit Board

Investigations on Delay Interconnect Lines for High-Speed Designs with the Numerical Technique

An improved method for test chip design

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Test compaction for small-delay defects using an effective path selection scheme

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Recent Developments on Time-Delay Neural Networks

Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill

Research progress on short duration test techniques and its application

On the delay performance in a large-scale wireless sensor network: measurement, analysis, and implications

The Status Quo and Trend of Research on Modern Fault Diagnosis

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Thermal-aware small-delay defect testing in integrated circuits

A comprehensive review of delay analysis techniques for solving concurrent delays