Properties of Schottky Contact in MSM UV Detectors Based on AlGaN/GaN Heterostructure

Zhou Jin,Hao Yilong,Wu Guoying,Yang Zhijian,Zhang Guoyi
DOI: https://doi.org/10.3969/j.issn.1674-4926.2005.z1.063
2005-01-01
Abstract:AlGaN/GaN hetero-structure samples are grown on sapphire substrate by MOCVD method.Ti/Al/Ti/Au and Ni/Au metal films are sputtered on the samples,respectively.They are thermally annealed in the N2 gas for the different time and temperatures,and become ohmic contact and Schottky contact,respectively.Both I-V curves and C-V curves are discussed in term of the measurement results.The I-Vcurves have very good symmetry,butC-V curves slowly lose their symmetry with the annealing time increasing.MSM PD have good performance on the UV/Visible contrast and selectivity and the photoconductive gain effect is observed in the MSM PD UV response curves.
What problem does this paper attempt to address?