A design model of gate-coupling NMOS ESD protection circuit

Wang Yuan,Jia Song,Chen Zhongjian,Zhang Ganggang,Ji Lijiu
DOI: https://doi.org/10.1109/ICSICT.2004.1436642
2004-01-01
Abstract:A design model is proposed to exactly simulate operating principles of gate-coupling NMOS (GCNMOS) ESD protection circuit under ESD stress. Using this model, adequate coupling capacitor Cn and coupling resistor Rn can be calculated to improve the efficiency of GCNMOS ESD protection circuit.
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