Abstract:The molecular chain and lamellar crystal orientation in ultrathin films (thickness < 100 nm) of poly-(di-n-hexylsilane) (PDHS) on silicon wafer substrates have been investigated by using transmission electronic microscopy, wide-angle X-ray diffraction, atomic force microscopy, and UV absorption spectroscopy. PDHS showed a film thickness-dependent molecular chain and lamellar crystal orientation. Lamellar crystals grew preferentially in flat-on orientation in the monolayer ultrathin films of PDHS, i.e., the silicon backbones were oriented along the surface-normal direction. By contrast, the orientation of lamellar crystals was preferentially edge-on in ultrathin films thicker than ca. 13 nm, i.e., the silicon backbones were oriented parallel to the substrate surface. We interpret the different orientations of molecular chain and lamellar crystal as due to the reduction of the entropy of the polymer chain near the substrate surface and the particularity of the crystallographic (001) plane of flat-on lamellae, respectively. A remarkable influence of the orientations of the silicon backbone on the UV absorption of these PDHS ultrathin films was observed due to the one-dimensional nature of sigma-electrons delocalized along the silicon backbone. With the silicon backbones perpendicular or parallel to the surface of the substrate, the UV absorbance increased or decreased with an increase of the angle between the incident UV beam direction and direction normal to the thin film, respectively.

Alignment of Parallel Rectangular Domains in Aluminum Films Deposited on Silicone Oil Surface

SURFACE MORPHOLOGY AND GROWTH MECHANISM OF THE Al FILMS DEPOSITED ON LIQUID SURFACES

Spontaneous Formation of Ordered Patterns in Al Films Deposited on Silicone Oil Surfaces

Expansion Effect of Liquid Substrates on the Ordered Structures in the Al Films

Growth Mechanism of Ordered Stress-Induced Patterns in Al Films Deposited on Silicone Oil Surfaces

Alignment of Ferroelectric Liquid Crystal on Surface SiO2 Films on Oblique Ion Beam Deposition

Pattern Formation under Residual Compressive Stress in Free Sustained Aluminum Films

Influence of Post-Annealing Treatment on the Morphology of Au Films Deposited on Liquid Surfaces

Microstructure dependence of ZnO:Al films on the deposition conditions and the surface morphology of silicon substrate

Growth Mechanism and Microstructure of Al Films Deposited on Ionic Liquid Surfaces

Growth and Morphology of Ultra-Thin Al Films on Liquid Substrates Studied by Atomic Force Microscopy

Thickness-dependent Molecular Chain and Lamellar Crystal Orientation in Ultrathin Poly(di-N-hexylsilane) Films.

Shrunk Lattice Structure and Interdiffusion Characteristics of 5 Nm Thick Al(2)O(3) Ultrathin Films Sputtered on Silicon.

Influence of the Liquid Substrate Temperature on the Band-Shaped Ordered Structures in an Al Film System

Formation Mechanism of Orderly Structures in Au Films Deposited on Silicone Oil Surfaces

Ordered structures and self-organized phenomena in Au films deposited on silicone oil surfaces

Microstructure and Magnetic Domains of Iron Films on Liquid Surfaces

Formation Mechanism and Orderly Structures of an Iron Film System Deposited on Silicone Oil Surfaces

Growth Characteristics and Properties of RuAlO Hybrid Films Fabricated by Atomic Layer Deposition

Low Loss Single Crystalline Aluminum Films Obtained on Si (1 1 1) Through Interfacial Modulation

Formation of the ferroelectric domains in epitaxial PbTiO3 thin films grown by metalorganic chemical vapor deposition