Abstract:A method of fluorination assisted electrothermal vaporization inductively coupled plasma mass spectrometry (FETV-ICP-MS) was developed to directly determine the trace impurities in niobium pentaoxide solid powder in which a poly(tetrafluoroethylene) (PTFE) emulsion was used as fluorinating modifier to promote the vaporization of refractory elements from a graphite furnace and to avoid the formation of thermally stable carbides. The solid sample was introduced into the graphite furnace in the form of slurry without any chemical pretreatments. The electrothermal vaporizer device was connected to the ICP system by a laboratory-built interface, and the flow rates of sample carrier gas and auxiliary carrier gas were optimized experimentally. The potentially polyatomic interferences resulting from the pyrolysates of PTFE were evaluated. A new method by stepwise diluting the sample matrix is proposed for investigating the matrix effect and the results showed that no obvious matrix effect was observed with a sample matrix (Nb2O5) concentration of less than 200 mg L-1. Under the optimal conditions, the absolute limits of detection for FETV-ICP-MS determination of Ta, Ti, Cr, W, Ni, Cu and Mn were in the range of 0.026-1.1 pg. For one analysis run, only 0.002 mg of Nb2O5 sample was required. The proposed method has been applied to determining the trace impurities in Nb2O5 powder, and both the results obtained from the external calibration method and the standard addition method were in a good agreement with those obtained by conventional nebulization ICP-MS.

Direct determination of trace impurities in high purity neodymium after in-situ analyte-matrix separation by fluorination assisted ETV-ICP-AES

Direct Determination of Trace Impurities in Niobium Pentaoxide Solid Powder with Slurry Sampling Fluorination Assisted Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry

Direct ICP-AES Determination of Trace Impurities in Silicon Dioxide Using Fluorinating Electrothermal Vaporization with Slurry Sampling

Direct Determination of Trace Titanium in High Purity Yttrium Oxide by Fetv/Icp-Aes

Determination of Trace Metal Impurities in Cerium Oxide by Fluorination-Assisted Etv-Icp-Aes after Hplc Separation

Direct analysis of titanium dioxide solid powder by fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry

Determination of Rare Earth Impurities in High Purity Zirconium Dioxide by Electrothermal Vaporization Inductively Coupled Plasma Atomic Emission Spectrometry Using 1-Phenyl-3-methyl-4-benzoyl-5-pyrazone As Extractant and Chemical Modifier

Determination of Impurity Elements in High-Purity Niobium Pentoxide by ICP-AES

Determination of trace rare earth impurities in high-purity cerium oxide by using electrothermal vaporization ICP-AES after HPLC separation with 2?ethylhexylhydrogen 2?ethylhexylphosphonate resin as the stationary phase

Determination of 13 Trace Impurities in High-Purity Tantalum Pentoxide by ICP-AES

Determination of titanium, nickel and lead by electrothermal vaporization-inductively coupled plasma atomic emission spectrometry with the use of fluorine -containing matrix modifier

Direct Determination of Rare Earth Impurities in Lanthanum Oxide by Fluorination Assisted Electrothermal Vaporization Inductively Coupled Plasma Atomic Emission Spectrometry with Slurry Sampling

In-situ Electrothermal Fluorination-Assisted Matrix Removal, Slurry Sampling, Graphite Furnace Atomic Absorption Spectrometry for the Determination of Trace-Level Chromium, Cobalt and Vanadium in Zirconium Dioxide Powder

Direct determination of trace silicon in lanthanum oxide by using a selective volatility and slurry sampling-FETV-ICP-AES

In-situ Separation of the Matrix for the Direct Determination of Traces of Chromium, Cobalt, and Nickel in Titanium Dioxide Powder by Electrothermal Atomic-Absorption Spectrometry with Slurry Sampling

Direct Determination of Trace Elements in Micro Amounts of Biological Samples Using Electrothermal Vaporization Coupled to Icp-Aes

Micro-sampling, high sensitivity ETV-ICP-MS method for the determination of trace rare earth impurities in high purity lanthanum oxide

Determination of Rare Earth Impurities in High-purity Lanthanum Oxide Using Electrothermal Vaporization/ICP-AES after HPLC Separation

Determination of Trace Amount of Vanadium in High Purity Y 2 O 3 by Electrothermal Vaporization－ICP－AES With Bi（PDC） 3 Coprecipitation

Direct determination of trace refractory elements in human serum by ETV–ICP–MS with in-situ matrix removal

Determination of Impurity Elements in High Purity Graphite by Inductively Coupled Plasma-Mass Spectrometry