Micro-sampling, high sensitivity ETV-ICP-MS method for the determination of trace rare earth impurities in high purity lanthanum oxide

Jun Yin,Bin Hu,Man He,Zucheng Jiang
2005-01-01
Atomic Spectroscopy
Abstract:A micro-sampling, high sensitivity electrothermal vaporization inductively coupled plasma mass spectrometry (ETV-ICP-MS) method using polytetrafluoroethylene as the chemical modifier is proposed for the determination of trace rare earth impurities in high purity La2O3. The mass spectral interferences and matrix effects of La in ETV-ICP-MS were investigated. The matrix effects in ETV-ICP-MS and conventional pneumatic nebulization (PN)ICP-MS along with ETV-ICP-MS and ETV-ICP-OES were critically compared, and some differences were observed. Under the optimal conditions, the absolute detection limits for ETV-ICP-MS determination of REEs were in the range of 5-75 fg, and for real sample analysis, only 1 mu g of La2O3 sample is required for one analysis. The proposed method was applied to the analysis of high purity La2O3 (99.99%-99.999%), and the results obtained both from the external calibration method and from the standard addition method were in good agreement with the recommended values.
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