The Effect of the Geometric Factor on the V-I Curve of Tl2212 Film

SY Ding,Y Liu,XF Wu,FY Lin,ZH Wang,L Qiu
DOI: https://doi.org/10.1088/0953-8984/13/30/306
2001-01-01
Journal of Physics Condensed Matter
Abstract:A numerical procedure is proposed for calculating the current density j and electric field E from measurements of the electric transport inside a sample with rectangular cross section by solving the non-linear electric field diffusion equation based upon the collective creep model. It is shown that the sample geometry greatly affects E and j and thus the V-I curve. To verify our numerical prediction, the V-I curve and critical current of Tl2Ba2CaCu2O8+x films with a rectangular cross section in various magnetic fields and temperatures were measured. Comparison shows that the numerical results agree well with the experimental data.
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