Critical Current Density in the Tl2212 Film

FY Lin,SY Ding,YH Zhang,XF Wu,ZH Wang
DOI: https://doi.org/10.1016/s0921-4534(00)00805-4
2000-01-01
Abstract:A method of numerical simulation combined with experimental curves of AC susceptibility (ACS) is proposed to determine the temperature dependent critical current density Jc0(T) without flux creep. Based on this method and ACS curves, we have determined the Jc0(T) of the Tl2212 thin film.
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