Transport Properties in Tl-2212 Film

Y Liu,H Luo,T Yang,X Leng,XF Wu,JW Lin,ZH Wang,HM Luo,SY Ding
DOI: https://doi.org/10.1088/0953-2048/15/3/318
2002-01-01
Superconductor Science and Technology
Abstract:We have measured the temperature dependence of the resistance of Tl2Ba2CaCu2O8+x (Tl-2212) thin film at various magnetic fields parallel and normal to the c-axis. Then the U(H) relationship and irreversibility line were obtained. An important parameter n in the material equation of the Tl-2212 thin film is obtained from the U(H) relationship. The V–I characteristic curves at different applied magnetic fields and temperatures were also measured. To testify the equivalence of the two measurements, we calculated V–I curves of the same thin film by solving the flux creep equation with the obtained material equation. A comparison between the independently measured and calculated V–I curves shows a satisfactory agreement. It is, therefore, concluded that we can combine the resistive broadening R–T measurement, which is conducted at a low current density and high temperature and the V–I curve, which can be carried out at a much lower temperature, expanding the range of temperature and current density in exploring the dynamics.
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