The effects of field and temperature on V-I curve for Ag-Bi2223 tape

Y.H. Zhang,S.Y. Ding,X.F. Wu,Q. Ding,F.Y. Lin,H. Luo,L. Qiu,Z.H. Wang,Z. Xu
DOI: https://doi.org/10.1016/S0921-4534(00)01143-6
2000-01-01
Abstract:Electric transport measurements and numerical simulation were made to observe effect of field H on V-I curve and critical current (I-c) for Ag-sheathed Bi(2-x)Pb(x)Sr(2)Ca(2)Cu(3)O(y)tapes (Ag-Bi2223). It is shown that the effect is mainly dynamic.
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