Effect of post-annealing on critical current density of (Bi,Pb)-2223/Ag tapes

M.Y. Li,X.P. Chen,T.M. Qu,H.P. Yi,Z. Han,Q. Liu
DOI: https://doi.org/10.1016/j.physc.2003.12.080
2004-01-01
Abstract:The effect of post-annealing on critical current density of (Bi,Pb)-2223/Ag tapes has been investigated. The fully reacted (Bi,Pb)-2223/Ag multifilament tapes were post-annealed in different processing parameters, including post-annealing temperature, dwelling time and oxygen partial pressure. Experimental results show that post-annealing at low temperature in reduced oxygen partial pressure can improve the critical current density. With decreasing oxygen partial pressure, the optimal temperature range of post-annealing shifts to lower temperature. The effect of post-annealing could be related to the increase of (Bi,Pb)-2223 phase and the formation of Pb3Sr2.5Bi0.5Ca2CuOy (3321 phase) as well as the improvement of gain connectivity.
What problem does this paper attempt to address?