Two-dimensional scaling of resistance in flux flow region in Tl2Ba2CaCu2O8 thin films

X.F. Lu,Z. Wang,H. Gao,L. Shan,Y.Z. Zhang,R.T. Lu,L. Fan,S.L. Yan,Z.D. Wang,H.H. Wen
DOI: https://doi.org/10.1016/j.physc.2004.08.011
2004-01-01
Abstract:The resistance of Tl2Ba2CaCu2O8 thin films has been measured when the angle between the applied fields and ab-plane of the film is changed continuously at various temperatures. Under various magnetic fields, the resistance can be well scaled in terms of the c-axis component of the applied fields at the same temperature in the whole angle range. Meanwhile, we show that the measurement of resistance in this way is a complementary method to determine the growth orientation of the anisotropic high-Tc superconductors.
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