Resistive upper critical magnetic field of a superconducting Bi-2201 thin film grown on a vicinal substrate

Y.Z. Zhang,R. Deltour,J.-F. de Marneffe,H.H. Wen,Y.L. Qin,L. Li,Z.X. Zhao,A.G.M. Jansen,P. Wyder
DOI: https://doi.org/10.1016/S0921-4534(00)01374-5
2000-01-01
Abstract:Transport properties have been measured for a superconducting Bi2Sr2-xLaxCuO6+delta (x approximate to 0.4) thin film grown on a vicinal SrTiO3 single crystal substrate in magnetic field up to 23.5 T. The thin film was patterned into crossed bridges for studying the upper critical magnetic field H-c2(T). Numerical analyses of our data and previously published data lead to the conclusion that upward curvature of H-c2(T) does not imply a divergent H-c2(T) value at T= 0 K.
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