Voltage Relaxation and Its Influence on Critical Current Measurements

S. Y. Ding,H. Luo,Y. H. Zhang,Q. Ding,F. Y. Ling,P. Zhang,X. F. Wu,L. Qiu,X. X. Yao
DOI: https://doi.org/10.1023/A:1007715411727
2000-01-01
Journal of Superconductivity
Abstract:Based on the collective creep model, we numerically studied evolution of electric field and current density in superconductors and its influence on transport measurements of critical current. It is shown that many experimental facts, such as the dependence of V-I curves on sweeping rate of applied current and voltage relaxation are the results of this evolution. The simulation results are confirmed by electric transport measurements on Ag-sheathed Bi 2− x Pb x Sr 2 Ca 2 Cu 3 O y tapes. Discussions on influences of the voltage relaxation on electric transport measurements including superconducting critical current are made.
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