Evidence of collective flux creep in YBa2Cu3O7−δ thin film

Haihu Wen,Zhongxian Zhao,h m wen
DOI: https://doi.org/10.1016/0038-1098(94)00860-4
IF: 1.934
1995-01-01
Solid State Communications
Abstract:Low electric field E-j(s) curves, normalized dynamical relaxation rate Q(T)=dln(j(s))/dln(E) and experimental critical current density j(s)(E=E(c)) were measured from 10K to 85K with a torque magnetometer in the field sweeping process. Basing on the Thermally Activated Flux Creep (TAFC) model and with the predetermined value for c=ln(v(O)B), we obtained the current dependent mu value directly from the experiment data. The theoretical predictions mu=3/2 for small bundle, mu=7/9 for large bundle collective flux creep and mu=1/7 for single vortex creep were proved by the experiment.
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