Flux Creep in YBa2Cu307-y Epitaxial Film

J. Sha,J.Z. Shi,Z.H. He,W.Z. Shi,X.H. Chen,N.L. Wang,X.A. Cheng,Z.P. Su,L.Z. Cao,ZH. Qi,Q.R. Zhang
DOI: https://doi.org/10.1016/s0921-4526(09)80166-x
1990-01-01
Abstract:The dissipation behavior in the mixed state of YBa2Cu307-y thin film has been studied. It is found that a current-independent resistivity can be described by Arrhenius law and that the activation energy U0 as a function of magnetic field can be described by a power law dependence on H. All of the above results will be included in a vortex glass model.
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