Evidence For Flux-Pinning Induced By Spatial Fluctuation Of Transition-Temperatures In Single-Domain (Y1-Xprx)Ba2cu3o7-Delta Samples

Hh Wen,Zx Zhao,Yg Xiao,B Yin,Jw Li
DOI: https://doi.org/10.1016/0921-4534(95)00395-9
1995-01-01
Abstract:The current density j(s) has been measured versus temperature at B = 1 T for single domain (Y1-xPrx)Ba2Cu3O7-delta (x = 0.00, 0.03, 0.05, 0.08) samples. It is found that the measured current density j, is enhanced by the substitution of Y with Pr, which manifests that extra pinning centers have been introduced into the samples. Detailed analysis show that the temperature dependence of the measured current density j(s)(T) as well as the normalized relaxation rate S(T) for all the four samples can be well explained basing on the model for flux pinning;induced by the spatial fluctuation of the transition temperatures, while the theoretical results obtained basing on the model for flux pinning induced by the spatial fluctuation of the charge carrier mean free path are completely inconsistent with the experiment data. Finally we conclude that the dominant pinning in our samples are resulted from the spatial fluctuation of the transition temperatures rather than the mean free path.
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