Fabrication and Characterization of the Size-Controlled and Patterned Nc-Si Dots

J Li,L Wang,XF Huang,M Jiang,W Li,ZY Wang,J Xu,ZG Liu,KJ Chen
DOI: https://doi.org/10.1088/1009-1963/9/7/013
2000-01-01
Chinese Physics
Abstract:A new method of phase-modulated excimer laser crystallization is adopted to fabricate the patterned nanometer-sized crystalline silicon (nc-Si) dots within the sandwiched structure (a-SiNx:H/a-Si:H/a-SiNx:H) films. The results of transmission electron microscopy, electron diffraction and Raman scattering show the ultra-thin and single-layer nc-Si films were patterned in the lateral direction and the size of crystallites is controlled by the thickness of as-deposited a-Si film in the longitudinal direction. The effects of the laser energy density on the structures of the samples and the crystallization mechanism are discussed.
What problem does this paper attempt to address?