An investigation on the epitaxial growth of GaN film on Si(111) substrate

H. X. Zhang,Z. Z. Ye,B. H. Zhao
DOI: https://doi.org/10.1023/A:1006766006826
2000-01-01
Journal of Materials Science Letters
Abstract:Single crystalline GaN films were deposited on Si(111) successfully using a simple vacuum reaction method. The surface of the GaN film is flat and crack-free. A pronounced GaN(0002) peak appears in the X-ray diffraction pattern. At room temperature, the photoluminescence spectrum shows that the GaN epilayer emits light at the wavelength of 365 nm with a full width at half maximum of 8 nm (74.6 meV).
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