Discharge Induced Enhancement of Diamond Nucleation on Si Via Hot Filament Chemical Vapor Deposition

JB Cui,NG Shang,RC Fang
DOI: https://doi.org/10.1063/1.367476
IF: 2.877
1998-01-01
Journal of Applied Physics
Abstract:A new pretreatment method involving a direct current discharge was used to enhance diamond nucleation on mirror polished silicon substrates employing hot filament chemical vapor deposition. A nucleation density of 108/cm2 was obtained. The nucleation density on Si substrates pretreated by the discharge at room temperature is similar to that treated at high temperature. The discharge process was monitored by optical emission spectroscopy. Raman scattering, scanning electron microscopy, and x-ray photoelectron spectroscopy were employed to analyze the pretreated Si substrate. The results suggest that a thin carbon layer formed during the discharge pretreatment process which contributes to the enhancement of diamond nucleation.
What problem does this paper attempt to address?