Electron Field Emission from Sic Si Heterostrucutres Synthesized by Carbon Implantation Using A Mevva Ion Source

DH Chen,SP Wong,WY Cheung,EZ Luo,W Wu,JB Xu,IH Wilson,RWM Kwok
1998-01-01
Abstract:Planar SiC/Si heterostructures were formed by high dose carbon implantation using a metal vapor vacuum are ion source. The variations of the field emission properties with the implant dose and annealing conditions were studied A remarkably low turn-on field of IV/mu m was observed from a sample implanted at 35 keV to a dose of 1.0x10(18) cm(-2) with subsequent annealing in nitrogen at 1200 degrees C for 2h. The chemical composition depth profiles were determined from x-ray photoelectron spectroscopy and the surface morphology was observed by atomic force microscopy. The formation of a thin surface stoichiometric SiC layer and the formation of densely distributed small protrusions on the surface are believed to be the two factors responsible for the efficient electron field emission.
What problem does this paper attempt to address?