Field Emission Characteristics of SiC Capped Si Tip Array by Ion Beam Synthesis

Dh Chen,Wy Cheung,Sp Wong,Ym Fung,Jb Xu,Ih Wilson,Rwm Kwok
DOI: https://doi.org/10.1116/1.581734
1999-01-01
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Abstract:High dose carbon implantation into Si tip array was performed to synthesize SiC/Si heterostructure tip array. This was done using a high beam current density metal vapor vacuum arc ion source. Silicon tip arrays were prepared by anisotropic chemical etching. An implantation energy of 35 keV using a dose of 1.0×1018 ions/cm2 was performed. The array was subsequently annealed in argon ambient at 1200 °C, for various times to form the SiC surface layer. Scanning electron microscopy shows that the Si tips were sharp and uniformly arranged. X-ray photoelectron spectroscopy confirmed that a thin SiC surface layer had been formed. Results show that electron emission properties measured in ultrahigh vacuum depended on the sample treatment. A typical turn-on field was 15 V/μm when the emission current density reaches 1 μA/cm2. This compares with a turn-on field of about 35 V/μm for an unimplanted Si tip array.
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