A new deduction of the threshold voltage for short-channel FDSOI MOSFET's using parabolic potential approach

Wensong Chen,Lilin Tian,Zhanqing Yu,Zhijian Li
IF: 1.019
1998-01-01
Chinese Journal of Electronics
Abstract:In this paper a new threshold voltage model is developed using parabolic potential approach. The physical meaning of the fitting parameter η in quasi-2-D method is clarified as solving the Poisson equation using parabolic potential method at different silicon depths. By proper adoption of the source/drain edge boundary conditions, excellent conformation between the model predicted threshold roll-off and DIBL effects with the two-dimensional numerical simulation results and experimental data is obtained. The proposed model provides more physical insight for technology and device design.
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