Optical spectral properties and short-wavelength optical storage properties of high reflection Ag5In5Te47Sb33 phase change films prepared by RF magnetron sputtering technology

Huiyong Liu,Fusong Jiang,Liqiu Men,Zhengxiu Fan,Fuxi Gan,
1998-01-01
Abstract:The optical spectral properties and short-wavelength optical storage properties of Ag5In5Te47Sb33 films are reported. The films are prepared by RF magnetron sputtering technology. The reflection of the crystalline film is 50% at 780 nm, and the difference of the reflection and reflectivity index is very large at 600-900 nm, which shows the profitable characteristics as the recording layer for high reflection CD-E system. The film also shows good recording properties at short wavelength. A high reflectivity can be obtained with low power and short pulse-width laser beam.
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