Preparation And Short-Wavelength Optical Storage Properties Of Ge-Te Alloy Phase Change Thin Film

Hy Liu,Fs Jiang,Lq Men,Zx Fan,Fx Gan
DOI: https://doi.org/10.1117/12.300711
1998-01-01
Abstract:The preparation method and short-wavelength optical storage properties of Ge-Te alloy phase change thin film are reported. The film was prepared by RF-sputtering technology. The deposited films was amorphous. The crystallization temperature was 190 degrees C. The optical spectrum measurements showed that the reflectivity of the crystalline state film was rather high-about 50% at 780nm, which may be suitable for CD-E storage medium. A static optical recording tester with an focused Argon laser beam (514.5nm) irradiating on the films was used to evaluate the optical storage performance of the films. The results showed that a rather large reflectivity contrast (larger than 15%) can be obtained at low power beam.
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