Short-wavelength optical storage properties of GeSb2Te4 phase-change thin films

Liqiu Men,Fusong Jiang,Chao Liu,Huiyong Liu,Fuxi Gan,
DOI: https://doi.org/10.1117/12.248700
1996-01-01
Abstract:The optical properties of GeSb 2Te 4 thin films prepared by vacuum RF-sputtering method at the wavelength region of 400 - 830 nm were studied. A comparatively large absorption was observed in the wavelength range 400 - 600 nm, which matches with the wavelengths of Argon laser. The optical storage characterizations of GeSb 2Te 4 thin film demonstrate clearly that larger reflectivity contrast can be obtained at lower power Argon laser (514.5 nm) irradiation. The erasing contrast is relatively lower but can be improved by multi-layer films match.
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