Calculation of the bandgap narrowing due to heavy doping in p-type strained Si1-xGex layers

Wengang Wu,Desheng Jiang,Jinsheng Luo
1997-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:To take the strain induced effects on valence band into account when calculating the bandgap narrowing (BGN) due to heavy doping in p-type pseudomorphic Si1-xGex layers grown on ��100�� Si substrate, an equivalent effective degeneracy (EED) model is proposed for the valence band structure of the strained alloy. The calculation results agree well with published experimental data and show that there is a maximum value of the BGN at a certain Ge fraction if dopant concentration exceeds about 2-3��1019cm-3, and it will decrease continuously as Ge fraction increases.
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