A new method of fault line selection for teed circuits with four-parallel transmission lines on the same tower

Pei-yu GUO,Neng-ling TAI,Zhong-an YU,Chun-ju FAN
2013-01-01
Abstract:Teed circuits with four-parallel lines on the same tower consist of four-parallel lines on the same tower and quadruple-lines on the same tower. After analyzing the fault line selection, a new method is proposed. The fault region is determined at first, and then the specific fault branch is identified. The mutual electromagnetic effect between four-parallel transmission lines is decoupled to obtain the relationship between the inverted-sequence current of two power source sides. According to that, the fault side is identified and the fault area can be determined quickly. The positive-sequence voltage difference is introduced to detect the fault branch precisely. Both a theoretical analysis and EMTP simulation results show that the method is correct and has high precision. This work is supported by National Natural Science Foundation of China (No. 51177066).
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