Defect-induced Ferromagnetism in Insulating Mn–P Codoped ZnO Grown in Oxygen-Rich Environment

L. Q. Zhang,Z. Z. Ye,B. Lu,J. G. Lu,J. Y. Huang,Y. Z. Zhang,Z. Xie
DOI: https://doi.org/10.1016/j.ssc.2012.10.042
IF: 1.934
2012-01-01
Solid State Communications
Abstract:Zn0.93Mn0.05P0.02O films have been prepared on quartz substrates by pulsed laser deposition (PLD). The ferromagnetic film obtained in oxygen-rich (40 Pa) environment is not carrier mediated, but coexists with dielectric state. The Mn ions are located at the substitutional Zn sites as revealed by the Mn K-edge XAFS spectroscopy. The Raman analysis indicated the existence of numerous vacancies, which is attributed primarily to P-Zn-2V(Zn) complex defects. This is experimentally confirmed by quenched ferromagnetism after annealing at 600 degrees C in O-2, due to break down of the P-Zn-2V(Zn) complex. In contrast, all the Zn0.93Mn0.05P0.02O films grown at lower (0.04-4 Pa) oxygen pressures (PO2) with and without post-annealing exhibited n-type conduction with paramagnetism. The results are consistent with the bound magnetic polaron (BMP) model, in which localized P-Zn-2V(Zn) complex defects in the insulating film mediated the ferromagnetic ordering. (C) 2012 Elsevier Ltd. All rights reserved.
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