Study on the influence of input capacitance to charge amplifier noise performance

Hao Li,Zhiyong Chen,Yonggui Dong
2012-01-01
Abstract:For MEMS sensors based on displacement to capacitance conversion, the influences of the sensing electrodes capacitance and the distributed capacitance to charge amplifier noise performance were theoretically analyzed. Attained results are cross checked via simulations and experimental measurements. It is shown that, for MEMS structures with larger sensing electrode capacitances, the input voltage noise of the operational amplifier is the main noise source of the charge amplifier. The output noise of charge amplifier increases significantly with the input capacitance, and there is a linear function between them. When the capacitance value of the sensing electrodes is small, the background noise, which is caused by the electric signal coupling, is the main noise source of charge amplifier implemented by discrete components. Printed circuit board design will be the key to the small capacitance detection resolution.
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