Analysis of the effect of stray capacitance on noise characteristics of AC-based capacitance measurement circuit

Xue Peng,Peng Lihui
DOI: https://doi.org/10.19650/j.cnki.cjsi.2011.02.008
2011-01-01
Abstract:The noise induced by stray capacitance in an AC-based capacitance measurement circuit for tomography application is studied.Using the noise model of Op-AMP,the effects of voltage noise,current noise and resistance noise on the output of AC-based capacitance measurement circuit are analyzed.A calculation formula for the estimation of peak to peak noise value of AC-based capacitance measurement circuit is presented and verified through experiments.Theoretical analysis and experimental result both demonstrate that the voltage noise of Op-AMp plays dominant role in the output noises of an AC-based capacitance measurement circuit.Finally proposes a selection guide for the Op-AMp in AC-based capacitance measurement circuit for tomography application.
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