Possibilities of Determining Non-Maxwellian EEDFs from the OES Line-Ratios in Low-Pressure Capacitive and Inductive Plasmas Containing Argon and Krypton

Xi-Ming Zhu,Yi-Kang Pu,Yusuf Celik,Sarah Siepa,Edmund Schuengel,Dirk Luggenhoelscher,Uwe Czarnetzki
DOI: https://doi.org/10.1088/0963-0252/21/2/024003
2012-01-01
Plasma Sources Science and Technology
Abstract:Optical emission spectroscopy (OES) is classically used to determine the electron temperature in low-temperature plasmas by assuming a Maxwellian electron energy distribution function (EEDF). However, non-Maxwellian EEDFs are often found in these plasmas. In this work, we propose an OES line-ratio method that is aimed at obtaining non-Maxwellian EEDFs, with a collisional–radiative model of argon and krypton. When applied for both a capacitively coupled plasma and an inductively coupled plasma, this method provides satisfactory results compared with those measured using a Langmuir probe.
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