Performance of Pentacene Thin Film Transistors Fabricated with Different Deposition Speeds

Hui-Kun Yao,Lei Sun,You-Feng Geng,Yu-Qian Xia,Yi-Jiao Wang,Zhi-Yuan Lun,Tai-Huan Wang,Wen-Tong Zhu,De-Dong Han
DOI: https://doi.org/10.1109/icsict.2012.6467745
2012-01-01
Abstract:Bottom-gated pentacene thin film transistors have been fabricated with different deposition speeds and the devices' current-voltage properties are reported. The pentacene films are formed through evaporation in low pressure. The characteristics of the surface morphologies and microstructures of the samples were studied respectively. We also studied the transfer characteristics and output properties. Pentacene-TFTs can exhibit excellent electrical properties while Vg changes from 0 to -70V, and Ion/Ioff ratio is larger than 104 and OFF-state current is smaller than -1.3×10-10A as Vd=-100V.
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