Simulation of Retention Behavior for the Phase Change Memory

Jian Chen,Decheng Song,Gang Du,Guijun Lian,Jinfeng Kang,Xiaoyan Liu
DOI: https://doi.org/10.1143/jjap.51.02bd10
IF: 1.5
2012-01-01
Japanese Journal of Applied Physics
Abstract:We developed a comprehensive simulation program of phase change memory (PCM) including the electrical, thermal, phase change and percolation model. The set, reset and retention behavior for a typical thin film phase change material (GST) are simulated and evaluated. Both the resistance evaluation and the micro phase change process are simulated that can help to understand of the phase change physical mechanism. The influence of pre-existing grains on the retention is evaluated considering the pre-existing grains' amount and its distribution.
What problem does this paper attempt to address?