Effect of Co-Reactants on Interfacial Oxidation in Atomic Layer Deposition of Oxides on Metal Surfaces

Jay V. Swarup,Heng-Ray Chuang,Amy L. You,James R. Engstrom
DOI: https://doi.org/10.1021/acsami.3c19033
IF: 9.5
2024-03-21
ACS Applied Materials & Interfaces
Abstract:We have examined the atomic layer deposition (ALD) of Al(2)O(3) using TMA as the precursor and t-BuOH and H(2)O as the co-reactants, focusing on the effects of the latter on both the ALD process and the possible modification of the underlying substrate. We employed a quartz crystal microbalance (QCM) to monitor ALD in situ and in real time, and the deposited thin films have been characterized using X-ray photoelectron spectroscopy, spectroscopic ellipsometry, X-ray reflectivity, and atomic force...
materials science, multidisciplinary,nanoscience & nanotechnology
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