Investigation on Thickness of Ultra-thin Carbon Protective Coatings on Slider Surface

ZHANG Hua-yu,XIE Xiao-qiang,SHI Yuan,LI Shan-dan,LIU Yi-wei
DOI: https://doi.org/10.3969/j.issn.1001-4381.2006.z1.008
2006-01-01
Abstract:Methods of measuring the thickness of ultra-thin DLC film and Si interlayer were investigated by AES,XPS,TEM in present paper.The results of XPS and AES are consistent,but a discrepancy existed between them with TEM.Clearing interface of DLC and Si layers can't be observed in HRTEM image.Furthermore,what led the different measured thickness among above three methods were investigated.
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