Raman Spectroscopy of Ultra-thin DLC Film Deposited by FCVA

YIN Yunfei,CHE Xiaozhou,LI Guofeng,MA Hongtao
2010-01-01
Abstract:FCVA is used to deposit ultra-thin DLC films with thickness of 50nm,30nm,10nm,5nm,2nm,respectively. Raman spectra at visible and ultra-violet excitation of tetrahedral amorphous carbon(ta-C) films have been studied as a function of film thickness.The visible-Raman spectra show that I_d/I_g increases and A_g/A_d decreases, while G-position shifts to a little lower wave number,when the thickness of film decreases from 50nm to 2nra Based on analysis results of ultra-violet Raman spectra,when the sample becomes thinner,I_t/I_g decreases,T-position shifts to higher wave number.Combining the two different wave-length Raman spectra,the G-position-dispersion is also depressed with decreasing film thickness;the films prepared by FCVA contain less sp~3 content and more ordered sp~2 clustering along when the thickness of film decreases from 50nm to 2nm.The EELS results also verify that the decrease DLC film thickness will cut down the sp~3 fraction.Raman spectra results are consistent with the value of measured hardness and internal stress for 50nm and 30nm DLC films.
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