Abstract:The crystallographic orientation and texture evolution mechanism of equiaxed Ti60 alloy plates were investigated in this study through plane strain compression tests. The EBSD analysis revealed that the received plate contained two characteristic textures that were perpendicular to each other, i.e., c-axis//TD (Component 1) and c-axis//RD (Component 2), with the latter being caused by the change in direction of the TD texture that was generated during the previous unidirectional rolling process into an RD direction in the cross-rolling process. The results demonstrated that, with increasing the deformation temperature from 930 °C to 960 °C and 990 °C, the intensity of the c-axis//TD texture (Component 1) initially rose to a peak value of 5.07, which then—subsequently—decreased significantly to 2.96 at 960 °C and 3.11 at 990 °C. Conversely, the intensity of the c-axis//RD texture (Component 2) remained relatively unchanged. These texture changes were correlated with slip system activity and the spheroidization of the primary alpha phase. For the c-axis//TD texture, the initial intensity of the texture components during compression at lower temperatures could be attributed to the incomplete dynamic spheroidization process of the α phase, which leads to the reinforcement of the c-axis//TD due to prismatic slip. As the deformation temperature increased, the dynamic spheroidization process became more prominent, thereby leading to a significant reduction in the intensity of the c-axis//TD texture. In contrast, the c-axis//RD texture exhibited difficulty in activating the prismatic slip and basal slip; in addition, it also encountered resistance to dynamic spheroidization, thus resulting in negligible changes in the texture intensity.

Characterization of Microtexture in Bi-2223 Tapes Using Electron Back-Scatter Pattern Orientation Imaging

Investigation of Local Texture Correlations in Bi-2223 High Temperature Superconductor Tapes

Texture Analysis of Monofilamentary, Ag-sheathed (pb,bi)2sr2ca2cu3ox Tapes by Electron Backscatter Diffraction (EBSD)

Choice of Bi2223 Unit Cell for Texture Studies Using Orientation Determination in the Scanning Electron Microscope

Local Texture Evolution during Rolling Deformation of Single Crystals of {100} Orientation

Local Orientation Variations in YBCO Films on Technical Substrates - A Combined SEM and EBSD Study

Biaxially Textured (bi, Pb)(2)Sr2Ca2Cu3Ox Thin Films on LaAlO3 Substrates Fabricated Via the Chemical Solution Deposition Method

On twinning and shear banding in copper single crystals with rolling texture orientations plane strain compressed at high strain rate

Growth of Biaxially Textured Yttria-Stabilized Zirconia Thin Films on Si(111) Substrate by Ion Beam Assisted Deposition

Development and Evolution of Biaxial Texture of Rolled Nickel Tapes by Ion Beam Bombardment for High Tc Coated Conductors

Preparation of C-Axis Textured Bi-2212 Thin Films on Silver Substrates by Using Chemical Solution Deposition

Ion-Beam Bombardment Induced Texture in Nickel Substrates for Coated High-T-C Superconductors

Texture Control and Its Impact on the Properties of SrBi2Ta2O9 Thin Films Prepared by Pulsed Laser Deposition

Evaluation of Texture in Pb(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)O<sub>3</sub> Films Prepared by Sol-Gel Route

Evaluation of texture in Pb(Zr0.52Ti0.48)O 3 films prepared by sol-gel route

Biaxial Texture Establishment and Evolution in IBAD-MgO Films under Different Ion-to-atom Ratios

ANISOTROPIC PROPERTIES OF <font>Bi</font>-2201 THIN FILMS GROWN ON VICINAL SUBSTRATES

Effect of Texture Dispersion on the Effective Biaxial Modulus of Cubic Polycrystalline Films

Anisotropy of the Reflectivity Spectra of A Bisrcacuo Single-Crystal Within the (001)-Plane

EXPERIMENTAL MEASUREMENT AND ANALYSIS ON ANISOTROPY CHARACTERISTIC OF THE CRITICAL CURRENT IN Bi-2223/Ag HTS TAPES

Mechanism of Crystallographic Orientation and Texture Evolution of Ti60 Alloy during Plane Strain Compression