Resistive Switching and Metallic-Filament Formation in Ag2S Nanowire Transistors

Zhi-Min Liao,Chong Hou,Qing Zhao,Ding-Sheng Wang,Ya-Dong Li,Da-Peng Yu
DOI: https://doi.org/10.1002/smll.200900642
IF: 13.3
2009-01-01
Small
Abstract:High-performance resistance switching (ON/OFF ratio ≈104) is achieved based on single Ag2S nanowire transistors with symmetrical drain–source electrodes (see image). A semiconductor–metal transition is observed by measuring the temperature dependence of the resistance when the device is switched from the OFF to the ON state. Gate-voltage-controlled switching is also demonstrated. Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
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