Failure analysis of single-chip integrated switching-power TPS54350

CHENG Qi,LIU Lan
DOI: https://doi.org/10.3969/j.issn.1674-6236.2010.03.029
2010-01-01
Abstract:This paper analyzes and solves the failure problems of integrated switching-power chip TPS54350 in a small load applications circuit.It found the root causes of device failure by microscopic appearance test,I-V curve test,X-ray test towards the failure chip and the typical application circuit and the exception test waveform.The typical application circuit of TPS54350 has an external voltage protection resistor,when power off,existing an anti-Sink current,causes the fluctuations of the input voltage which interferes the ENA of the chip indirectly.This falses start chips and makes the current of anti-chip poured into the chip from the outside and finally resulting in chip circuitry appears latch failure.using TPS54550 to replace TPS54350(ENA-side have stronger anti-interference capability),and removing the undervoltage protection resistance of UVLO side,solves the failure problems,achieves the small load applications that 12V transforms to 5V,100mA.
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